FL05BT04 [TAIYO YUDEN]

Ferrite Bead, 1 Function(s), 3A;
FL05BT04
型号: FL05BT04
厂家: TAIYO YUDEN (U.S.A.), INC    TAIYO YUDEN (U.S.A.), INC
描述:

Ferrite Bead, 1 Function(s), 3A

文件: 总13页 (文件大小:430K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
巻線データランフィルタ  
WOUND TORROIDS AND BEADS  
OPERATING TEMP.  
K25VJ105 C(製品自己発熱含む)  
fIncluding self-generated heatg  
特長ꢀFEATURES  
YUse of high loss ferrite materials for excellent high frequency noise absorp-  
tion.  
YHigh impedance for normal mode applications.  
Y05 RD type available in taping for automatic insertion.  
Y06 BT type is designed for high current applications (3 A).  
Y損失分の大きなフェライト材料を使用  
Yノーマルモード用としてインピーダンスが大きい  
Yテーピング供給により自動挿入対応 f05RDg  
Y大電流対応 f06BTg  
用途ꢀAPPLICATIONS  
Y各種デジタル機器におけるデータラインの高周 波ノイズ吸収  
YAbsorption of high frequency noise from digital equipment data lines.  
形名表記法ꢀORDERING CODE  
FFL-R / RD Type  
1
3
4
6
公称インダクタンス fA Hg  
包装  
Q
形状  
RQ  
形式  
FL  
RW 小数点  
単品  
巻線形データラインフィルタ  
リングコア、単線リード直  
出し  
IR0  
200  
1.0  
20.0  
T
Z
E
リールテーピング  
つづら折りテーピング  
R D  
リングコアース使用ピンタイプ  
QWスペース  
別仕様  
QWスペース  
2
5
7
コアの長辺寸法 f g  
インダクタンス許容差 f%g  
05  
ꢀꢀ4.8 ꢀꢀ  
A
E
公称値 以上  
特殊許容差  
当社管理記号  
Q
標準品  
別仕様連番  
QWスペース  
01V10  
Z
F L 0 5 R D 2 0 0 A T  
1
2
3
4
8
5
10  
6
11  
7
12  
1
2
3
4
5
6
7
9
1
3
4
6
Nominal inductancefA Hg  
Packaging  
Shape  
RQ  
R D  
Type  
FL  
FRWdecimal point  
Q
Bulk  
Wound torroids and beads  
Ring core, with single wire lead  
Ring core, with case, pin type  
Example  
IR0  
1.0  
T
Z
Tape & Reel  
Ammo  
200  
20.0  
QWBlank space  
E
Special code  
2
QWBlank space  
5
Dimensions of core(dia.)f g  
7
Inductance tolerancef%g  
05  
4.8ꢀꢀ ꢀꢀ  
A
E
Higher than normal value  
Special tolerance  
Internal code  
Q
Standard product  
01V10  
Product classification code  
QWBlank space  
FFL-BT Type  
5
1
3
4
試作番号  
当社管理記号  
形状  
BT  
形式  
FL  
04  
巻線データラインフィルタ  
円柱、多孔コア  
Q
標準品  
QWスペース  
2
コアの外径寸法 f g  
06  
6.0ꢀꢀ ꢀꢀ  
Z
F L 0 6 B T 0 4  
4
2
5
1
3
5
1
3
4
Product classification code  
04  
Internal code  
Shape  
BT  
Type  
FL  
Wound torroids and beads  
Cylinder, porous core  
Q
Standard product  
QWBlank space  
2
Dimensions of core(dia.)fmmg  
06  
6.0ꢀꢀ ꢀꢀ  
334  
外形寸法ꢀEXTERNAL DIMENSIONS  
h05RDi  
h05R i  
h06BT04i  
5
インピーダンス周 波数特性ꢀIMPEDANCE-FREQUENCY CHARACTERISTICS  
FL05RD / FL05RTYPE  
FL06BTTYPE  
その他の特性につきましては、ご要  
望に応じて検  
討、対応致します。  
Please contact TAIYO YUDEN for further informa-  
tion in regard to other characteristics.  
Measured by HP4291A  
アイテム一覧ꢀPART NUMBERS  
形名  
インダクタンス  
Inductance  
hAHi  
インピーダンス  
Impedance  
流抵抗  
定格電流  
Ordering code  
DC Resistance  
Rated current  
hEiftypicalg  
hEifmaxg  
hAifmaxg  
J1.0  
-0.5  
1.0  
0.08  
0.05  
0.5  
F L 0 5RD1R0EG  
F L 0 5R 1 0 0A  
F L 0 5RD1 0 0A  
2800fat 400MHzg  
2900fat 200MHzg  
10min  
1.5  
3.0  
F L 0 5R 2 0 0AKQ  
20min  
0.08  
0.05  
2000fat 100MHzg  
1000fat 150MHzg  
F L 0 5RD2 0 0AG  
E
F L 0 5BT 0 4  
Gは包装記号が入ります。fTDリールテーピング、ZDつづら折りテーピング、スペースD単品g  
G Please specify the packaging codefTDTape & reel, ZDammo, Blank spaceDbulkg  
Qは、個 別仕様が入ります。  
Q Please specify the special code  
セレクションガイド  
Selection Guide  
アイテム一覧  
Part Numbers  
特性図  
Electrical Characteristics  
梱包  
Packaging  
頼性  
使用上の注意  
Reliability Data  
Precautions  
P.10  
etc  
P.335  
P.335  
P.336  
P.338  
P.356  
335  
梱包ꢀPACKAGING  
1最小受注単位数 Minimum Quantity  
3 リール寸法 Reel size  
FL05RD  
最小受注単位数fpcs.g  
Minimum Quantity  
Type  
袋づめ  
リールテーピング つづり折りテーピング  
Bulk  
Tape and Reel  
EE  
Ammo  
EE  
FL05R  
500  
400  
250  
FL05RD  
FL06BT  
2000  
1500  
EE  
EE  
2 テーピング寸法ꢀTaping dimensions  
FL05RD  
寸法表示の hi は実寸法。  
Dimensions in parenthesis are measured value.  
Type  
記号  
寸法[mmfinchg]  
Symbol  
Dimension  
D1  
9.0max f0.354maxg  
H2  
9.0max f0.354maxg  
T
3.7max f0.146maxg  
H
H
P
1
31.0max f1.22maxg  
18.0M1.0 f0.709M0.039g  
12.7M1.0 f0.500M0.039g  
12.7M0.3 f0.500M0.012g  
3.85M0.8 f0.152M0.031g  
6.35M1.3 f0.250M0.051g  
F1  
P
P
P
0
1
2
9.0 K0.5 f 0.354 KJ00..003200 g  
J0.75  
W
F
1
FL05RD  
5.0 J0.6 f 0.197JK00..002084 g  
K0.2  
d
B0.6 fB0.024g  
Qh  
0M2.0 f0M0.079g  
f0.709JK00..002084 g  
J1.0  
W
18.0  
K0.5  
W
W
b
0
12.5min f0.492ming  
3.0min f0.118ming  
0max f0maxg  
F2  
2
D
L
t
0
4.0M0.3 f0.157M0.012g  
11.0max f0.433maxg  
0.7M0.2 f0.028M0.008g  
F1.20ピッチにつき累積誤差M2mm以内  
F2.貼付テープは台紙よりはみ出さないこと  
F1.Accumulated error for 20 pitches shall be within M2mm.  
F2.Pasting tape shall not exceed paste board.  
336  
1/9  
RELIABILITY DATA  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
K25VJ105C  
K25VJ85C  
K25VJ105C  
LAYFLD  
1.Operating temperature  
Range  
Including self-generated heat  
LHL□□□D  
Including self-generated heat  
[LHL□□□]  
5
K40VJ85C  
2.Storage temperature  
Range  
Within the specified tolerance  
3.Rated current  
LAD  
The maximum DC value having inductance within 10% and  
temperature incease within 20by the application of DC bias.  
LHL□□□YLAV35D  
The maximum DC value having inductance decrease within  
10% and temperature incease within the following speci-  
fied temperature by the application of DC bias.  
Reference temperatureD20CfLHL06, LAV35g  
D25CfLHL08, LHL10, LHL13g  
D30CfLHLC06, LHLZ06, LHL16,  
LHLP□□g  
FBD  
No disconnection or appearance abnormaliry by continuous  
current application for 30 min. Chage after the application shall  
be within ±20% of the initial value.This is not guaranteed for  
electrial characteristics during current application.  
FLD  
The maximum DC value having temperature rise within  
specified value.  
Within the  
specified  
tolerance  
Refer to  
FBD  
4.Impedance  
individual Measuring equipmentDImpedance analyzer fHP4191Agor  
specifica-  
tion  
its equivalent  
Measuring frequencyDSpecified frequency  
FL06BTD  
Measuring equipmentD4291A fHPg or its equivalent  
Measuring frequencyDSpecified frequency  
LAD  
5. Inductance  
Within the specified tolerance  
Within the specified toler-  
ance  
Measuring equipmentDLCR meterfHP4285A + HP42851A or  
its equivalentg  
Measuring frequencyDSpecified frequency  
LHL□□□D  
Measuring equipmentDQ meterfHP4285AJHP42851A or  
its equivalentg  
LCR meterf HP4262Ag or its  
equivalentfat 1KHzg  
Measuring frequencyDSpecified frequency  
LAV35D  
Measuring equipmentDQ meterfHP4285AJHP42851A or  
its equivalentg  
Measuring frequencyDSpecified frequency  
FL05RD  
Measuring equipmentDHP4262A or its equivalent.  
Measuring frequencyD1kHz  
339  
2/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
FL05  
Type  
FL06BT  
Type  
LA02 Type/  
LA03 Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
Within the specified tolerance  
Within the  
specified  
tolerance  
6.Q  
LAD  
Measuring equipmentDLCR meterfHP4285AJHP42851A  
or its equivalentg  
Measuring frequencyDSpecified frequency  
LHL□□□YLAV35fexcept LHLPgD  
Measuring equipmentDQ meterfHP4285AJHP42851A or  
its equivalentg  
5
Q meterfHP4342Agor its equivalent  
Measuring frequencyDSpecified frequency  
LAD  
Within the specified tolerance  
Within the specified tolerance  
L/LDWithinM5L  
7.DC Resisitance  
Measuring equipmentDlow ohmmeter fA&D AD5812 or its  
equivalentg  
LHL□□□YFBYLAV35YFLD  
Measuring equipmentDDC ohmmetr  
LAD  
Within the  
specified  
tolerance  
8.Self resonance frequency  
Measuring equipmentDNetwork analyzerfAnritsu MS620J  
or its equivalentg  
LHL□□□YLAV35fexcept LHLPgD  
Measuring equipmentDfHP4191A, 4192Ag its equivalent  
LAD  
L/LD  
L/LD  
9.Temperature characteristic  
WithinM7L  
WithinM5L  
Change of maximum inductance deviation in step 1to5  
step  
1
TemperaturefCg  
20  
2
K25 fMinimum operating temperatureg  
3
20 fStandard temperatureg  
4
J85 fMaximum operating temperatureg  
5
20  
LHLYLAV35D  
[LHL□□□, LAV35]  
Change of maximum inductance deviation in step 1to5  
Temperature at step 1D20C  
Temperature at step 2DMinimum operating temperature  
Temperature at step 3D20C fStandard temperatureg  
Temperature at step 4DMaximum operating temperature  
Temperature at step 5D20C  
341  
3/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
No abnormality such as cut lead  
,
or looseness.  
No abnormality such as cut  
mality such lead,or looseness.  
as cut lead  
LAD  
10.Terminal strengthD  
No abnor-  
Apply the stated tensile force progressively in the direction  
to draw terminal.  
tensile force  
,
force(N)  
25  
durationfSg  
or loose-  
ness.  
5
LHL□□□YLAVD  
5
Apply the stated tensile force progressively in the direction  
to draw terminal.  
Nominal wire  
force  
diameter tensile  
durationfSg  
30M5  
fNg  
Bdfmmg  
0.3<BdT0.5  
0.5<BdT0.8  
0.8<BdT1.2  
5
10  
25  
FBAD  
A bead shall be fixed and static loaded 20M1Nf2.0M0.1 kgfg  
in axial direction of lead wire in 10M1 seconds.  
FL05RD  
Fix the component in the direction to draw terminal,and  
gradually apply the tensile force of 4.9 N.  
LHL□□□D  
11.Over current  
There shall  
be no scorch  
or short of  
wire.  
Measuring currentDRated currentP2  
DurationD5min.  
Number of measuringDone time  
LAD  
No abnormality such as cut lead, or looseness.  
12.Terminal strengthD  
Suspend a mass at the end the terminalincline the body  
though angel of 90 and return it to initial position.This op-  
eration is done over a period of 2-3 sec.Then second bend  
in the opposite direction shall be made.  
Number of bendsDTwo times.  
bending  
Nominal wire  
Bending  
Mass reference  
diameter tensile  
force  
weight  
Bdfmmg  
fNg  
fkgg  
0.3<BdT0.5  
2.5  
5
0.25  
0.50  
0.5<BdT0.8  
LHYFBYLAVD  
Suspend a mass at the end the terminalincline the body  
though angel of 90 and return it to initial position.This op-  
eration is done over a period of 2-3 sec.Then second bend  
in the opposite direction shall be made.  
Number of bendsDTwo times.  
Nominal wire  
diameter tensile  
Bdfmmg  
Bending  
force  
fNg  
Mass reference  
weight  
fkgg  
0.3<BdT0.5  
0.5<BdT0.8  
0.8<BdT1.2  
2.5  
5
0.25  
0.5  
10  
1.0  
LHL□□□D  
13.Insulation resisitanceD  
between the terminals  
and body  
100MΩmin.  
Applied voltageD500 VDC  
DurationD60 sec.  
FBAYFBRD  
14.Insulation resistanceD  
between terminals and  
core  
1MΩmin.  
Applied voltageD100 VDC  
DurationD60M5 sec.  
fOther than  
m a t e r a i l  
code MAg  
LHL□□□〕  
15.WithstandingDbetween  
No abnor-  
mality such  
as insula-  
tion dam-  
age  
Accoding to JIS C5102. 7. 1. 3 fCg  
Metal global method  
the terminals and body  
Applied voltageD500 VDC  
DurationD60 sec.  
343  
4/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
L/LDWithin K10L  
LAYLAV35D  
16.DC bias characteristic  
17.Body strength  
L/LD  
K10L  
Within  
Measure inductance with appliation of rated current using  
LCR meter to compare it with the initial value.  
LA02YLAV35D  
No abnormality as damage.  
No signifi- No abnor-  
cant dam- mality as  
age such as damage.  
cracks on  
Applied forceD30N  
DurationD10 sec.  
5
SpeedDShall attain to specified force in 2 sec.  
body.  
LA03YLA04YLA05D  
Applied forceD50N  
DurationD10 sec.  
SpeedDShall attain to specified force in 2 sec.  
FBD  
Applied forceD50M3N  
DurationD30M1 sec.  
L/LD  
L/LD  
L/LD  
LAD  
18.Resisitance to vibration  
AppearanceD AppearanceD L/LD  
No No WithinM5L  
abnomality abnomality QD30min.  
L/LD Impedance  
WithinM5L WithinM5L WithinM5L  
Accoding to JIS C5102 8. 2  
QD30min.  
Q/QD  
QD15min.  
Vibaration typeDA  
WithinM10L  
DirectionsD2 hrs each in X, Y and Z directions totalD6hrs.  
Frequency rangeD10 to 55 to 10Hzf1min.g  
AmplitudeD1.5mm  
WithinM5L changeD  
Q changeD WithinM20L  
WithinM30L  
Mounting methodDSoldering onto printed board.  
RecoveryDAt least 1hr of recovery under the standard  
condition after the test, followed by the mea-  
surement within 2hrs.  
fLHLPD  
only L/Lg  
LHL□□□YFBYLAVD  
Accoding to JIS C0040  
Vibaration typeDA  
DirectionsD2 hrs each in X, Y and Z directions totalD6hrs.  
Frequency rangeD10 to 55 to 10Hzf1min.g  
AmplitudeD1.5mm fBut don't exceed acceleration 196m/s  
ftwo powerg  
Mounting methodDSoldering onto printed board.  
345  
5/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
19.Resistance to shock  
No significant abnormality in appearance  
No signifi-  
cant abnor-  
mality in ap-  
pearance  
LAYLAV35D  
Drop test  
Impact materialDconcrete or vinyl tile  
HeightD1m  
Total number of dropsD10 times  
LAD  
20.Solderability  
At least 75L of terminal electrode is A t l e a s t A t l e a s t  
At least 75L of lead circu, ference is  
5
coverd by new solder.  
Solder temperatureD230M5C  
DurationD2M0.5 sec.  
75L of lead 90L of lead  
covered by new solder.  
c
i
r
c
u
,
c i r c u ,  
ference is ference is  
covered by covered by  
new solder. new solder.  
LHL□□□D  
Solder temperatureD235M5C  
DurationD2M0.5 sec.  
Immersion depthDUp to 1.5mm from bottom of kinked part.  
[LHL06, LHLC06, LHLZ06]  
DUp to 1.5mm from bottom of case.  
[LHL08, LHL10, LHL13, LHL16]  
FBD  
Solder temperatureD230M5C  
DurationD3M1 sec.  
Immersion depthDUp to 1.5mm from terminal root.  
LAV35D  
Solder temperatureD230M5C  
DurationD2M0.5 sec.  
FL05RD  
Solder temperatureD230M5C  
DurationD2M0.5 sec.  
Immersion depthDUp to 2V2.5mm from terminal root.  
FL06BTD  
Solder temperatureD230M5C  
DurationD3M1 sec.  
Immersion depthDUp to 0.5V1.0mm from terminal root.  
347  
6/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
21.Resisitance to soldering  
heat  
No significant abnormality L/LD  
in appearance  
No signifi- No signifi- L/LD  
Refer to  
No signifi- LAD  
Within M5L cant abnor- cant abnor- WithinM5L individual cant abnor- Solder temperatureD260M5CfLA02g  
QD15min. mality in ap- mality in ap- QD30min. specifica- mality in ap- 270M5CfLA03YLA04YLA05g  
DurationD5M0.5 sec.One time  
pearance  
pearance  
tion  
pearance  
Inductance Impedance  
Impedance Immersed conditions  
DInserted into substrate with= 1.6mm  
changeD  
WithinM5L  
Q changeD  
WithinM30L  
fLHLPD  
change  
D
change:  
RecoveryDAt least 1hr of recovery under the standard  
condition after the test, followed by the mea-  
surement within 2hrs.  
5
WithinM20L  
WithinM20L  
LHL□□□D  
Solder bath method  
only L/Lg  
Solder temperatureD260M5C  
DurationD10M1 sec.  
DUp to 1.5mm from bottom of kinked part.  
[LHL06, LHLC06, LHLZ06]  
DUp to 1.5mm from bottom of case.  
[LHL08, LHL10, LHL13, LHL16, LHLP□□]  
Manual soldering  
Solder temperatureD350M10CfAt the tip of soldering irong  
DurationD5M1 sec.  
DUp to 1.5mm from bottom of kinked part.  
[LHL06, LHLC06, LHLZ06]  
DUp to 1.5mm from bottom of case.  
[LHL08, LHL10, LHL13, LHL16, LHLP□□]  
CautionDNo excessive pressing shall be applied to terminald  
RecoveryD4 to 24hrs of recovery under the standard con-  
dition after the tset.  
FBD  
Solder bath method  
Condition 1  
Solder temperatureD260M5C  
DurationD10M1 sec.  
Immersion depthDUp to 1.5mm from terminal root.  
Condition 2  
Solder temperatureD350M5C  
DurationD3M1 sec.  
Immersion depthDUp to 1.5mm from terminal root.  
RecoveryD3hrs of recovery under the standard condition  
after the test.  
LAV35D  
Solder temperatureD260M5C  
DurationD5M0.5 sec.  
Immersion depthDUp to 2.0 to 2.5mm from botoom of  
kinked part.  
RecoveryD4 to 24hrs of recovery under the standard con-  
dition after the tset.  
FLD  
Solder conditionD260M5C10M1 sec.  
Immersion depthDUp to 0.5 to 1.0mm from terminal root.  
RecoveryD3hrs of recovery under the standard condition  
after the test.  
349  
7/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
FL05  
Type  
FL06BT  
Type  
LA02 Type/  
LA03 Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
Pleasa avoid the ultrasonic cleaning of  
this product.  
No signifi- P l e a s e  
cant abnor- avoid the ul-  
mality in ap- t r a s o n i c  
FBD  
22.Resisitance to solvent  
Solvent temperatureD20V25C  
DurationD30M5 sec.  
pearance  
cleaning of  
Solvent typeDAcetone, trichloroethylene  
Impedance this product.  
changeD  
RecoveryD3hrs of recovery under the standard condition  
after the test.  
5
WithinM20L  
L/LD  
WithinM10L WithinM10L WithinM10L No abnor- No abnor- WithinM10L  
QD30min. Q/QD QD15min. mality mality QD20min. specifica- mality  
WithinM30L  
Inductance Impedance  
changeD changeD  
L/LD  
L/LD  
AppearanceD AppearanceD L/LD  
Refer to  
AppearanceD LAD  
23.Thermnal shock  
individual No abnor- Conditions for 1cycle  
Step  
Temperature  
f
Cg  
Durationfming  
J0  
K3  
tion  
Impedance  
changeD  
1
2
3
4
K25  
30M3  
Within 3  
30M3  
Room temperature  
J2  
K0  
WithinM10L WithinM20L  
Q changeD  
WithinM20L  
J85  
Room temperature  
Within 3  
WithinM30L  
Number of cyclesD5 cycles  
fLHLPD  
RecoveryDAt least 1hr of recovery under the standard  
condition after the removal from test chamber,  
followed by the measurement within 2hrs.  
only L/Lg  
LHL□□□D  
Accoding to JIS C0025  
Conditions for 1 cycle  
Step  
Temperature  
f
Cg  
Durationfming  
Minimum operating  
1
2
3
4
30M3  
Within 3  
30M3  
J0  
temperature  
K3  
Room temperature  
Maximum oparating  
J2  
temperature  
K0  
Room temperature  
Within 3  
Number of cyclesD10 cycles  
LHL□□□〕  
D5 cycles FBA, FBR  
4 to 24hrs of recovery under the standard con-  
f
g
Recovery  
D
dition after the removal from the test cfamber.  
LHL□□□〕  
D3hrs of recovery under the standard condition af-  
ter the removal from the test cfamber.fFBA, FBRg  
LAVD  
Conditions for 1 cycle  
Step  
Temperature  
f
Cg  
Durationfming  
Minimum operating  
1
2
3
4
30M3  
Within 3  
30M3  
J0  
K3  
temperature  
Room temperature  
Maximum oparating  
J2  
K0  
temperature  
Room temperature  
Within 3  
Number of cyclesD10 cycles  
RecoveryDAt least 1hr of recovery under the standard  
condition after the removal from test chamber,  
followed by the measurement within 2hrs.  
FLD  
Accoding to JIS C0025  
Conditions for 1 cycle  
Step  
Temperature  
f
Cg  
Durationfming  
J0  
1
2
3
4
K25  
30M3  
Within 3  
30M3  
K3  
Room temperature  
J2  
K0  
J85  
Room temperature  
Within 3  
Number of cyclesD10 cycles  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
351  
8/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
L/LD  
L/LD  
L/LD  
AppearanceD L/LD  
LAYLAV35D  
TemperatureD40M2C  
HumidityD90 95LRH  
DurationD1000 hrs  
24.Damp heat  
WithinM10L WithinM10L WithinM10L  
QD30min. Q/QD QD15min.  
WithinM30L  
No abnor- WithinM10L  
mality  
QD20min.  
V
Impedance  
changeD  
WithinM20L  
RecoveryDAt least 1hr of recovery under the standard re-  
moval from test chamber, followed by the mea-  
surement within 2hrs.  
5
FBD  
TemperatureD60M2C  
HumidityD90V95LRH  
DurationD1000 hrs  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
L/LD  
L/LD  
L/LD  
AppearanceD  
L/LD  
Refer to  
AppearanceD LAYLAV35D  
25.Loading under damp heat  
WithinM10L WithinM10L WithinM10L No abnor-  
WithinM10L individual No abnor- TemperatureD40M2C  
QD20min. specifica- mality HumidityD90V95LRH  
tion Impedance DurationD1000 hrs  
QD30min. Q/QD  
WithinM30L  
QD15min.  
mality  
Imductance  
changeD  
WithinM10L  
Q changeD  
WithinM30L  
fLHLPD  
changeD  
Applied currentDRated current  
WithinM20L RecoveryDAt least 1hr of recovery under the standard re-  
moval from test chamber, followed by the mea-  
surement within 2hrs.  
only L/Lg  
LHL□□□D  
TemperatureD40M2C  
HumidityD90V95LRH  
DurationD1000M24 hrs  
Applied currentDRated current  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
FLD  
TemperatureD60M3C  
HumidityD90V95LRH  
DurationD500 fJ12, K0ghrs  
Applied currentDRated current  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
LAYLAV35D  
L/LD  
WithinM10L WithinM10L WithinM10L  
QD30min. Q/QD QD15min.  
WithinM30L  
L/LD  
L/LD  
L/LD  
26.Loading at high tempera-  
ture  
WithinM10L  
QD20min.  
TemperatureD85M2C  
DurationD1000 hrs  
Applied currentDRated current  
RecoveryDAt least 1hr of recovery under the standard re-  
moval from test chamber, followed by the mea-  
surement within 2hrs.  
353  
9/9  
RELIABILITY DATAꢀ  
Specified Value  
Item  
Test Method and Remarks  
LA02 Type/  
LA03 Type  
FL05  
Type  
FL06BT  
Type  
LA04 Type  
LA05 Type  
LHL□□□  
FBA/FBR  
LAV35  
L/LD  
L/LD  
L/LD  
AppearanceD  
L/LD  
Refer to  
AppearanceD LAD  
27.Low temperature life test  
WithinM10L WithinM10L WithinM10L No abnor-  
WithinM10L individual No abnor- TemperatureDK25M2C  
QD20min. specifica- mality DurationD1000 hrs  
Impedance RecoveryDAt least 1hr of recovery under the standard re-  
QD30min. Q/QD  
WithinM30L  
QD15min.  
mality  
Inductance  
tion  
change  
D
changeD  
moval from test chamber, followed by the mea-  
surement within 2hrs.  
WithinM10L  
Q changeD  
WithinM30L  
fLHLPD  
WithinM20L  
5
LHL□□□D  
TemperatureDK40M3C  
only L/Lg  
DurationD1000M24 hrs  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
LAV35D  
TemperatureDK40M3C  
DurationD1000 hrs  
RecoveryDAt least 1hr of recovery under the standard re-  
moval from test chamber, followed by the mea-  
surement within 2hrs.  
FLD  
TemperatureDK40M3C  
DurationD500fJ12, K0ghrs  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
AppearanceD  
No abnor-  
mality  
Refer to  
AppearanceD LHL□□□D  
28.High temperature life test  
individual No abnor- TemperatureD105M3C  
specifica- mality DurationD1000M24 hrs  
tion Impedance RecoveryD1 to 2hrs of recovery under the standard con-  
Inductance  
changeD  
changeD  
dition after the removal from the test cfamber.  
WithinM10L  
Q changeD  
WithinM30L  
WithinM20L  
FLD  
TemperatureD85M3C  
DurationD500fJ12, K0ghrs  
RecoveryD1 to 2hrs of recovery under the standard con-  
dition after the removal from the test cfamber.  
355  
PRECAUTIONS  
LA TypeLH TypeFB TypeFL Type  
Stages  
Precautions  
Technical considerations  
1.Circuit Design  
Operating environment,  
1.The products described in this specification are intended for  
use in general electronic equipment,(office supply  
equipment, telecommunications systems, measuring  
equipment, and household equipment). They are not  
intended for use in mission-critical equipment or systems  
requiring special quality and high reliability (traffic systems,  
safety equipment, aerospace systems, nuclear control  
systems and medical equipment including life-support  
systems,) where product failure might result in loss of life,  
injury or damage. For such uses, contact TAIYO YUDEN  
Sales Department in advance.  
5
2.PCB Design  
Design  
1.When Inductors are mounted onto a PC board, hole dimensions on the board should  
match the lead pitch of the component, if not, it will cause breakage of the terminals or  
cracking of terminal roots covered with resin as excess stress travels through the  
terminal legs.  
1.Please design insertion pitches of a base in the pitches that  
fitted a terminal interval.  
3.Considerations for  
automatic placement  
Adjustment of mounting machine  
1.Excessive impact load should not be imposed on the  
products when mounting onto the PC boards.  
2.Mounting and soldering conditions should be checked  
beforehand.  
1. When installing products, care should be taken not to apply distortion stress as it may  
deform the products.  
4.Soldering  
Wave soldering  
1.Please refer to the specifications in the catalog for a wave  
soldering.  
2.Do not immerse the entire Inductors in the flux during the  
soldering operation.  
Lead free soldering  
1.When using products with lead free soldering, we request to  
use them after confirming of adhesion, temperature of  
resistance to soldering heat, soldering etc sufficiently.  
Recommended conditions for using a soldering iron:  
Put the soldering iron on the land-pattern.  
Soldering iron's temperature - Below 350 ℃  
Duration - 3 seconds or less  
1.If products are used beyond the range of the recommended conditions, heat stresses  
may deform the products, and consequently degrade the reliability of the products.  
The soldering iron should not directly touch the inductor.  
Cleaning conditions  
5.Cleaning  
6.Handling  
1.LA type, LH type  
LA type, LH type  
Please do not do cleaning by a supersonic wave.  
Handling  
1.If washing by supersonic waves, supersonic waves may deform products.  
1.Keep the inductors away from all magnets and magnetic  
objects.  
1.There is a case that a characteristic varies with magnetic influence.  
1.There is a case to be damaged by a mechanical shock.  
Mechanical considerations  
1.Please do not give the inductors any excessive mechanical  
shocks.  
2.LH type  
2.LH type  
If inductors are dropped onto the floor or a hard surface they  
should not be used.  
There is a case to be broken by a fall.  
Packing  
1.Please do not give the inductors any excessive mechanical  
shocks.  
1.There is a case that a lead route turns at by a fall or an excessive shock.  
In loading, please pay attention to handling indication  
mentioned in a packing box (a loading direction / number of  
maximum loading / fragile item).  
7.Storage conditions  
Storage  
Storage  
1. Under a high temperature and humidity environment, problems such as reduced  
1.To maintain the solderability of terminal electrodes and to  
keep the packing material in good condition, temperature  
and humidity in the storage area should be controlled..  
Recommended conditions  
solderability caused by oxidation of terminal electrodes and deterioration  
of taping/packaging materials may take place.  
Ambient temperatureꢀꢀꢀꢀꢀ 040℃  
Humidity  
Below 70 % RH  
The ambient temperature must be kept below 30. Even  
under ideal storage conditions, solderability of products  
electrodes may decrease as time passes. For this reason,  
inductors should be used within one year from the time of  
delivery.  
In case of storage over  
6 months, solderability shall be  
checked before actual usage.  
357  

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